Firma Neumonda, Autor bei News-Research

Trust is good, DRAM testing is better

23. September 2024 Firma NeumondaPosted in ElektrotechnikTagged application specific, dram, lightweight, long term, low-cost, neumonda, Packaging, qualification, Rhinoe tester, semiconductor, Test Equipment

Qualification and testing of semiconductor components is one of the most expensive and complicated parts in the manufacturing process of memory ICs. Due to the size, complexity and costs of […]