Optical characterization of IR emitters

CAS 140D IR – Precise wavelength measurement in the infrared range

Instrument Systems’ new CAS 140D IR spectroradiometer has been optimized for spectral measurements in the SWIR (short-wave infrared) range. It features the proven high level of measurement accuracy and reliability of the CAS 140D series, recognized worldwide as a reference for wavelengths of 780 to 1700 nm. Compared to its predecessor model from the CAS 140CT series, the CAS 140D IR offers a significantly enhanced performance: Thanks to the newly designed optical structure, its throughput is up to 70% higher. The proportion of scattered light has again been significantly reduced. The new electronic platform enables a faster processing of measurement data with a minimum integration time of 1 ms and a scanning time of 9 ms. The advantages for the user are higher productivity due to shorter measurement times and higher accuracy and repeatability.

VTC 4000 – Near-field analysis of VCSELs

Instrument Systems’ VTC 4000 near-field camera was specially designed for the ultrafast, precise 2D analysis of VCSEL arrays. It enables polarization-corrected measurement of the performance of an emitter or array. Due to a unique calibration concept, the 2D near-field characterization takes place with unprecedented measurement accuracy. This concept is based on flat-field and polarization correction, and corrects the polarization dependence of the optical system. The calibrated VTC 4000 thus allows the absolute measurement of power and measurement of the polarization properties of each individual emitter within the camera field of view in the one-shot process. Like all Instrument Systems’ measuring instruments, the VTC 4000 camera is traceably calibrated to national standards (PTB) and provides measured values with absolute accuracy. Manufacturers can exploit the full power efficiency of VCSELs while ensuring safe operation.

VTC 2400 – Far-field analysis of infrared sources

The VTC 2400 from Instrument Systems is a high-resolution infrared camera that was custom-fit for 2D far-field analysis of the beam strength distribution of VCSEL and IR emitters. The cost-effective measurement system consists of a translucent, diffuse Lambert scattering screen and a monochrome camera specialized in measurements in the near infrared range. A light-tight camera body makes the system suitable for both laboratory and production applications. In the measurement setup, the screen stands between the radiation source (DUT) and the infrared camera, so that the typical radiation characteristic of the DUT is visible on the screen. The VTC 2400 infrared camera captures this 2-dimensional image in a single measurement and converts the irradiance [W/m²] into the beam strength distribution [W/sr] of the DUT via a calibration.

Presentation at SPIE Digital Optical Technologies (ICM)

Parallel to LASER WoP, the World of Photonics Congress will take place in the neighboring ICM, where Instrument Systems will be represented with a lecture by Dr. Amir Sharghi: “Two-dimensional LIV and beam quality characterization of individual emitters in a VCSEL array”. Date: at 08:40am on Wednesday, 28 June 2023 in Room 21.

Visit us at Booth A3.209 at LASER World of Photonics in Munich
from 27–30 June 2023